Measurement thickness of glass substrate and height of exposure mask

Using the specular‑reflection type CMOS laser displacement sensor CD33‑L30, both exposure mask height control and glass thickness measurement are performed with a single setup. The distance to the exposure mask is measured to adjust the optimal height; subsequently, when the glass substrate passes above, its thickness is measured. For high‑transparency glass substrates, thicknesses of 0.7 mm or greater can be measured from one side, eliminating the need for an opposed two‑sensor arrangement.

• Small Laser Displacement Sensors

  CD33 Series

  Half-palm size. Ideal for built-in use with smaller machines

  

• Displacement Sensor Communication Units

  UQ1 Series

  Can be connected to Mitsubishi Electric PLCs The industry’s first displacement sensor control unit