Measuring flatness and thickness of PV substrate
Transparent photovoltaic (PV) substrates can be measured with high precision when using the CD5-W85 with specular reflective mode. If the calculation function of the amplifier is used, the labor-intensive setup of flatness and thickness calculations can be performed quickly and easily.
Products Used
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High-performance Multi-unit Laser Displacement Sensors
CD5 Series
Next level integration of accuracy, stability, and operability
Application Examples for FPD/PV
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