Visual inspection of microchips

  • Visual inspection of microchips

The OPX-18 enables visual inspection of microchip components. By adopting a cube beam splitter as its optical element, it suppresses the ghosting commonly observed in conventional half‑mirror types, providing higher‑definition images. It can also detect fine scratches.

Products Used

  • Sensing Coaxial Lighting

    OPX Series

    Surface light source with a narrow directivity angle

    OPX Series

Application Examples for Electronic Components

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