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  • Discontinued Products

For suitable alternatives, please feel free to contact us.

Applications

  • Thickness measurement for substrate polishing

  • Faster glass substrate profile control

  • Substrate height measurement

  • Exposure head Z-axis control

  • Glass substrate double-feeding detection

  • Liquid crystal glass thickness inspection

  • Mask height control and glass substrate thickness measurement

  • Glass chipping inspection

  • Solar panel assembly accuracy inspection

  • Measurement of external size of wafer ingots

  • Wafer film thickness measurement

  • Metal frame warpage measurement

  • Chucking detection for minute workpieces

  • Brake pad parallelism measurement

  • Dashboard inspection

  • Tire appearance inspection

  • Rotation angle measurement for airplane parts

  • Grinding wheel deflection measurement

  • Measurement of metallic column cut length

  • Measurement of welded boiler misalignment

  • Inclination detection for hot workpieces

  • Coiler starting end/step detection

  • Detection for thin sheet joints

  • Thickness measurement of aluminum materials

Application Database

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