The CDX series of laser displacement sensors monitor smartphone panel assembly precision.
The specular reflection-type CDX-L15A is capable of achieving a measurement accuracy of ±1 μm, offering plenty of leeway even for applications where slight variations can result in poor assembly.

The CDX series of laser displacement sensors measure warpage of glass substrates.
The specular reflection type CDX-L15A is capable of measuring the warpage of transparent glass substrates in units as small as 0.25 μm.
In addition, high-speed measurement is possible thanks to a max.
sampling period of 12.5 μs, enabling sampling that is up to 8 times faster than conventional models.

Measuring width of the sheet by 2D displacement sensor LS series.
Having two LS sensor and detect the position of edges. Then, width of the sheet can be calculated and position of the sheet can be controlled by sending information from LS series to the control system. LS series is diffuse type so it can be installed in small space.

Detecting chipped part of glass plate for FPD by specular laser displacement sensor CD33-L85.
By utilizing control unit UQ1-02, connecting to Mitsubishi MELSEC-Q series and setup can be done automatically. Setup software "UQ1 Navigator" is ready for easy setup for this application.

Specular type CD5-L25 can measure not only distance to the glass surface but also glass thickness stably.

It can measure transparent PV (Photo Voltaic) substrate precisely.
Using calculation function with multiple sensor heads, you can easily find out the flatness or thickness.

By using multiple CD5-W85 sensor heads on specular mode, it can measure warpage or thickness of transparent objects precisely.
Multi calculation with one controller makes the measurement quick and easy.

Thickness of transparent film or sheet can be measured by high accuracy laser displacement sensor CD5-LW25 in repeat accuracy of 0.02μm.
The distance to both sides of the film to be measured by two sensor heads and the thickness will be calculated using data from those sensor heads.

You can measure the thickness of glossy electrode substrate precisely by specular mode of CD5-W85.

CD5-W30 (specular mode) can precisely measure the distance from glass top surface, not back surface and let the inspection camera focus accurately.

CD5 can measure the warpage of clear LCD glass, by its specular mode with resolution 0.02μm.
By calculating peak and bottom values of each sensor, the precise measurement of warpage is possible.

Installed in the inspection equipment of wind-pressure deformation, CD33-250 can measure the warpage of the panel.
Its measurement range is up to 400mm with the resolution 75μm.

To control picking arm position precisely to handle exposure mask safely, the distance to the measurement of warpage of exposure mask is very important.
The position of transparent exposure mask surface can be measured by specular type of C-MOS laser displacement sensor CD33.

By using specular type C-MOS displacement sensor CD33-L30, measurement of glass thickness and height of exposure mask can be done at one time.
Specular type displacement sensor can measure thickness of high transparency glass plate so height of exposure mask and glass thickness can be measured from one direction which can reduce number of sensor heads.
By utilizing control unit UQ1 and its software "UQ1 Navigator", setup can be done very easily in short time.

Thickness measurement of glass plate for FPD can be done by multiple CD5-L25. It measures thickness of the glass plate by detecting two reflected light from 1st surface and 2nd surface of the glass.
By using displacement sensor control unit UQ1 series, you can connect sensor heads to Mitsubishi MELSEC-Q series without any setting and any ladder programs. UQ1 has original communication interface "FIrST" with other UQ1 series so you can get calculated result using multiple measurement results from sensor heads.

When two glass plates were loaded to next stage, the plates may be broken so detecting overlapping of glass plates is very important.
By two laser displacement sensor CD33-L30N*, measurement of thickness of the glass plate is possible. Also, those sensors can be connected to Mitsubishi MELSEC-Q series through control unit UQ1-02 easily without ladder programs. Calculation can be possible by the controller.

Dimensions inspection of assembled PV plate by laser displacement sensor CD33-85N*.
Its repeat accuracy is 10um at measurement distance 85mm. By connecting those sensors to Mitsubishi MELSEC-Q series through control unit UQ1-02, you can get measurement result very easily without setup and ladder programs in short time.

LS-100 series can measure position of PV silicon substrate precisely on the production line. It prevents destruction of the substrate.