Individual printed material that overlap during transfer can be counted. Simply detecting workpieces by peak height is unstable because they can move up and down during transfer.
The CDX has a height difference measurement function to output the difference between the current value and the measurement value before a specified number of sampling times. With this function, workpieces can be counted stably without being influenced by up and down movement because height differences of overlapping workpieces can be extracted.
Even when print patterns have extreme changes in reflectance, such as from white to black, measurement can be carried out without measurement failures or response delays thanks to our in-house developed ATMOS image sensor.